X - The plot point of the IP reading (m)
Y - Line (m)
Z - elevation (m)
T1X - IP current location in local coordinates (m)
T2X - IP infinite location in local coordinates (m)
R1X - Lead potiential location in local coordinates (m)
R2X - Far potiential location in local coordinates (m)
VP - Primary Voltage in (mV)
I - Current (A)
IP_Avg - Raw IP reading (mV/V)
IP[0] - IP[20] - Raw IP gates reading
Q - Standard deviation of IP readings 
QC - Quality Control
Chg - Chargeability (mV/V)
N - Potiential dipole number
SP - Spontaineous polerization 
Stack - Number of stacks taking during the reading
Stn - The plot point of the IP reading (m)
RSCheck - the contact resistance (ohm)
Topo - The elevation
T2Y - The line location of the infinite in local coordinates (m)
T2Z - The elevation of the infinite in local coordinates (m)
T1X_NAD83Z8NUTME - IP current location in UTM coordinates (m)
T1X_NAD83Z8NUTMN
T2X_NAD83Z8NUTME - IP infinite location in UTM coordinates (m)
T2X_NAD83Z8NUTMN
R1X_NAD83Z8NUTME - Lead potiential location in UTM coordinates (m)
R1X_NAD83Z8NUTMN
R2X_NAD83Z8NUTME - Far potiential location in UTM coordinates (m)
R2X_NAD83Z8NUTMN
Stn_NAD83Z8NUTME - The Plot point in UTM Coordinates (m)
Stn_NAD83Z8NUTMN
Calcappres_final - The Final calculated apparent resistivity (ohm*m)
IP_final - The final chargeability (mV/V)
IP_err_final - the final standard deviation of the IP reading
MF - Metal Factor